This paper proposes a synthesis of different electrical methods used to estimate the temperature of power semiconductor devices. The following measurement methods are introduced: the voltage under low current levels, the threshold voltage, the voltage under high current levels, the gate-emitter voltage, the saturation current, and the switching tim...
Robustness study of a module on the basis of a representative drive cycle is mandatory for safety reasons, cost and lifetime estimation. The power modules for motor drives are subject to multiple failure modes which are due to many damaging factors. Generally we perform the damage evaluation of power modules by thermal and active power cycling agei...
PCIM Europe 2012 - International Exhibition & Conference for Power Electronics, Intelligent Motion and Power Quality 2012 , Nuremberg, ALLEMAGNE, 08-/05/2012 - 10/05/2012