Stöger-Pollach, Michael Löffler, Stefan Maurer, Niklas Bukvišová, Kristýna
Published in
Ultramicroscopy
Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on Cˇerenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Pér...
Mandziak, Anna Figuera, Juan de la Prieto, Jose Emilio Prat, Jordi Foerster, Michael Aballe, Lucía
Published in
Ultramicroscopy
We present a custom-made sample holder system for use in Elmitec Low Energy and PhotoEmission Electron Microscopes. It consists of two different sample holder bodies: one with a filament for high temperature measurements (up to more than 1500 K) and the other with integrated electromagnets for the in-situ application of in-plane/out-of-plane small ...
Caplins, Benjamin W Blanchard, Paul T Chiaramonti, Ann N Diercks, David R Miaja-Avila, Luis Sanford, Norman A
Published in
Ultramicroscopy
Improvements in the mass resolution of a mass spectrometer directly correlate to improvements in peak identification and quantification. Here, we describe a post-processing technique developed to increase the quality of mass spectra of strongly insulating samples in laser-pulsed atom probe microscopy. The technique leverages the self-similarity of ...
Borovytsky, Volodymyr
Published in
Ultramicroscopy
Abbe theory of image formation can be expanded from two-dimensional to three-dimensional space. It has to consider an optical system that forms an image of a grating in an object space. It is possible to introduce various inclinations of this grating relatively the optical axis round the axis in the object plane that is parallel to its slits. In th...
Oveisi, E Spadaro, M C Rotunno, E Grillo, V Hébert, C
Published in
Ultramicroscopy
Competitive mechanisms contribute to image contrast from dislocations in annular dark-field scanning transmission electron microscopy (ADF-STEM). A clear theoretical understanding of the mechanisms underlying the ADF-STEM contrast is therefore essential for correct interpretation of dislocation images. This paper reports on a systematic study of th...
Jiao, Yangbohan Zhuang, Jian Zheng, Qiangqiang Liao, Xiaobo
Published in
Ultramicroscopy
Scanning ion conductance microscopy (SICM), as an emerging non-contact in situ topography measurement tool with nano resolution, has been increasingly used in recent years in biomedicine, electrochemistry and materials science. In the conventional measurement method of SICM, the sample topography is constructed according to the position of the prob...
Velazco, A Nord, M Béché, A Verbeeck, J
Published in
Ultramicroscopy
STEM imaging is typically performed by raster scanning a focused electron probe over a sample. Here we investigate and compare three different scan patterns, making use of a programmable scan engine that allows to arbitrarily set the sequence of probe positions that are consecutively visited on the sample. We compare the typical raster scan with a ...
Du, Ming Jacobsen, Chris
Published in
Ultramicroscopy
During follow-on calculations, we found a few minor errors in our previous publication [ Ultramicroscopy 184 , 293–309 (2018); doi:10.1016/j.ultramic.2017.10.003]. We present here the necessary corrections. The full revised manuscript, with the corrected parts indicated in blue color text, is available at https://arxiv.org/abs/2004.10069 .
Du, Ming Jacobsen, Chris
Published in
Ultramicroscopy
Electron and x-ray microscopes allow one to image the entire, unlabeled structure of hydrated materials at a resolution well beyond what visible light microscopes can achieve. However, both approaches involve ionizing radiation, so that radiation damage must be considered as one of the limits to imaging. Drawing upon earlier work, we describe here ...
Naresh-Kumar, G Alasmari, A Kusch, G Edwards, P R Martin, R W Mingard, K P Trager-Cowan, C
Published in
Ultramicroscopy
Understanding defects and their roles in plastic deformation and device reliability is important for the development of a wide range of novel materials for the next generation of electronic and optoelectronic devices. We introduce the use of gaseous secondary electron detectors in a variable pressure scanning electron microscope for non-destructive...
