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X-ray magnetic linear dichroism in absorption at the L edge of metallic Co, Fe, Cr, and V

Authors
  • M M, Schwickert
  • G Y, Guo
  • M A, Tomaz
  • W L, O Brien
  • Gerry Harp
Type
Published Article
Journal
Physical Review B
Publisher
American Physical Society
Publication Date
Aug 14, 1998
Volume
58
Issue
8
Pages
4289–4289
Source
SETI Institute
License
Unknown

Abstract

It is demonstrated that x-ray magnetic linear dichroism (XMLD) in absorption spectroscopy is a viable technique for element-specific magnetic characterization of metallic thin films and multilayers. XMLD is measured at the Fe, Co, Cr, and VL 2, 3 edges, and varies from 1–11% of the edge jump in the absorption coefficient, with a magnitude that scales with the square of the magnetic moment. The XMLD spectra show satisfactory agreement with first principles calculations of this effect.

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