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Visualizing Three-Dimensional Micromechanical Response in Nanomaterials

Authors
  • Bronfenbrenner, David
  • Bibee, Matthew
  • Mehta, Apurva
Type
Preprint
Publication Date
Apr 27, 2010
Submission Date
Apr 27, 2010
Source
arXiv
License
Yellow
External links

Abstract

Understanding mechanical properties of materials requires not only complete determination of the three-dimensional response at a local scale, but also knowledge of the mode or the mechanism by which deformation takes place. Probing mechanical response at such a depth can be only achieved through a diffraction based method. In spite of this, diffraction based methods still are not commonly employed for strain measurements because they are perceived as very time intensive and non-intuitive. Herein we introduce the concept of a diffraction strain ellipsoid, and show how its shape, thickness, and orientation represent the complete deformation state in a powerfully visual and intuitive way. We also show how the geometry of the ellipsoid can be very quickly determined from x-ray diffraction data obtained using a large area detector, and how it can be used to understand micromechanical deformation of nanocrystalline materials.

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