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Visualizing Three-Dimensional Micromechanical Response in Nanomaterials

  • Bronfenbrenner, David
  • Bibee, Matthew
  • Mehta, Apurva
Publication Date
Apr 27, 2010
Submission Date
Apr 27, 2010
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Understanding mechanical properties of materials requires not only complete determination of the three-dimensional response at a local scale, but also knowledge of the mode or the mechanism by which deformation takes place. Probing mechanical response at such a depth can be only achieved through a diffraction based method. In spite of this, diffraction based methods still are not commonly employed for strain measurements because they are perceived as very time intensive and non-intuitive. Herein we introduce the concept of a diffraction strain ellipsoid, and show how its shape, thickness, and orientation represent the complete deformation state in a powerfully visual and intuitive way. We also show how the geometry of the ellipsoid can be very quickly determined from x-ray diffraction data obtained using a large area detector, and how it can be used to understand micromechanical deformation of nanocrystalline materials.

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