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Using X-ray CT based tree-ring width data for tree growth trend analysis

Authors
  • Vannoppen, Astrid
  • Maes, Sybryn
  • Kint, Vincent
  • De Mil, Tom
  • Ponette, Quentin
  • Van Acker, Joris
  • Van den Bulcke, Jan
  • Verheyen, Kris
  • Muys, Bart
Publication Date
Jan 01, 2017
Source
Ghent University Institutional Archive
Keywords
Language
English
License
Unknown
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