Time-Dependent Single-Event Effects in CMOS LC-Oscillators

Authors

• Prinzie, Jeffrey; 93261;
• De Smedt, Valentijn; 49159;

Publication Date

Sep 01, 2019

Source

Lirias

Keywords

• Science & Technology
• Technology
• Engineering, Electrical & Electronic
• Nuclear Science & Technology
• Engineering
• Impulse-Sensitive Function (Isf)
• Oscillators
• Radiation Hardening By Design
• Single-Event Upsets (Seus)
• Two-Photon Absorption (Tpa) Laser
• Technology
• Transients

License

Unknown

External links

• Full record on lirias.kuleuven.be