Temperature and strain mappings over forward biased power IGBT cross-section area by Œ-Raman spectroscopy
- Authors
- Publication Date
- Sep 09, 2015
- Source
- Kaleidoscope Open Archive
- Keywords
- Language
- English
- License
- Unknown
- External links
Abstract
EPE'15 ECCE-Europe, 2015 17th European Conference on Power Electronics and Applications, Geneve, SUISSE, 09-/09/2015 - 10/09/2015
