Temperature mapping by µ-Raman spectroscopy over cross-section area of power diode in forward biased conditions

Authors

• Kociniewski, Thierry
• Moussodji, Jeff
• Khatir, Zoubir

Publication Date

Jan 01, 2014

Source

Kaleidoscope Open Archive

Keywords

• Temperature Characterization
• Mesure De Temperature
• Electronique De Puissance
• [ Spi.Tron ] Engineering Sciences [Physics]/Electronics

Language

English

License

Unknown

External links

• Full record on hal.archives-ouvertes.fr