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Substrate suppression of thermal roughness in stacked supported bilayers.

Authors
  • DeCaro, Curt M
  • Berry, Justin D
  • Lurio, Laurence B
  • Ma, Yicong
  • Chen, Gang
  • Sinha, Sunil
  • Tayebi, Lobat
  • Parikh, Atul N
  • Jiang, Zhang
  • Sandy, Alec R
Type
Published Article
Journal
Physical Review E
Publisher
American Physical Society
Publication Date
Oct 01, 2011
Volume
84
Issue
4 Pt 1
Pages
41914–41914
Identifiers
PMID: 22181182
Source
Medline
License
Unknown

Abstract

We have fabricated a stack of five 1,2-dipalmitoyl-sn-3-phosphatidylethanolamine (DPPE) bilayers supported on a polished silicon substrate in excess water. The density profile of these stacks normal to the substrate was obtained through analysis of x-ray reflectivity. Near the substrate, we find the layer roughness and repeat spacing are both significantly smaller than values found in bulk multilayer systems. The reduced spacing and roughness result from suppression of lateral fluctuations due to the flat substrate boundary. The layer spacing decrease then occurs due to reduced Helfrich repulsion.

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