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Study of the Relationship between the Edge Effect and the Phenomenon of Focusing X-Rays in Flat Crystals

Authors
  • Drmeyan, H. R.1, 2
  • Trouni, K. G.1
  • Truni, A. K.3
  • 1 Institute of Applied Problems of Physics, National Academy of Sciences of the Republic of Armenia, Yerevan, 0014, Armenia , Yerevan (Armenia)
  • 2 Shirak State University Named after M. Nalbandyan, Gyumri, 3126, Armenia , Gyumri (Armenia)
  • 3 Mkhitar Heratsi Yerevan State Medical University, Yerevan, 0025, Armenia , Yerevan (Armenia)
Type
Published Article
Journal
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
Publisher
Pleiades Publishing
Publication Date
Nov 01, 2021
Volume
15
Issue
6
Pages
1365–1370
Identifiers
DOI: 10.1134/S1027451021060306
Source
Springer Nature
Keywords
Disciplines
  • Article
License
Yellow

Abstract

AbstractThe relationship between the edge effect and phenomenon of the focusing of X-rays in an interferometric two-block system with flat plates is studied. It is theoretically justified and experimentally shown that the edge effect makes a significant contribution to the formation of a focal spot at the output of the interferometer. It is experimentally proven that both the diffraction focusing in a two-block system and edge effect disappear in the case of thick plates because both phenomena are characterized by the linear absorption of X‑ray radiation. It is also shown that, in the case of a primary wide wave, neither the edge effect nor focusing occurs in a system consisting of two plane-parallel plates, while the reflection is clearly split along the edges only when a narrow beam from a point source is incident on the input of the first block.

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