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Simultaneous quantitative imaging of surface and magnetic forces

Authors
  • Forchheimer, Daniel
  • Platz, Daniel
  • Tholen, Erik A.
  • Haviland, David B.
Type
Preprint
Publication Date
Mar 08, 2013
Submission Date
Mar 08, 2013
Identifiers
DOI: 10.1063/1.4812979
Source
arXiv
License
Yellow
External links

Abstract

We demonstrate quantitative force imaging of long-range magnetic forces simultaneously with near-surface van-der-Waals and contact-mechanics forces using intermodulation atomic force microscopy. Magnetic forces at the 200 pN level are separated from near-surface forces at the 30 nN level. Imaging of these forces is performed in both the contact and non-contact regimes of near-surface interactions.

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