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A simple and reliable technique to characterize amplitude to phase modulation distortion for high-frequency amplifiers and nonlinear devices.

Authors
  • Jauregui, Rigoberto
  • Portilla, Joaquin
  • Reynoso-Hernández, J A
  • Hirata-Flores, F I
Type
Published Article
Journal
Review of Scientific Instruments
Publisher
American Institute of Physics
Publication Date
July 2013
Volume
84
Issue
8
Pages
84708–84708
Identifiers
DOI: 10.1063/1.4819229
PMID: 24007089
Source
Medline
License
Unknown

Abstract

This paper presents a simple and reliable measurement system for characterizing the amplitude to phase modulation (AM-PM) characteristics of high frequency amplifiers and nonlinear devices. The AM-PM measurement system is based on a null detector implemented with a double balanced mixer, and requires a voltmeter and a calibrated phase shifter. A 12 W class A radio frequency power amplifier has been designed using a GaN transistor, and the AM-PM has been measured using both the method proposed in this work and the classical method with a calibrated vector network analyzer. A good correlation between both methods is observed, which validates the proposed method.

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