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SEFI Modeling in Readout Integrated Circuit induced by Heavy Ions at Cryogenic Temperatures

Authors
  • Artola, Laurent
  • Ducret, S.
  • Advent, F.
  • Hubert, Guillaume
  • Mekki, Julien
Publication Date
Jul 16, 2018
Source
HAL-INRIA
Keywords
Language
English
License
Unknown
External links

Abstract

This paper presents for the first time a modeling approach of SEFI which takes into account all the physical and electrical processes from the radiation particle down to the event at the system level. This work was focused on the evaluation of SEFI sensitivity by experimental and simulation analyses of a ROIC designed by Sofradir for their IR image sensors. Relevant correlations between simulation and experimental results of SEFI cross sections for heavy ions were presented and discussed. The simulation results confirmed the strong SEFI robustness of the ROIC at 57 K.

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