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Secondary-electron yields and their dependence on the angle of incidence on stainless-steel surfaces for three energetic ion beams

Authors
  • Thieberger, P.
  • Hanson, A.L.
  • Steski, D.B.
  • Zajic, V.
  • Zhang, S.Y.
  • Ludewig, H.
Publication Date
Apr 01, 2000
Identifiers
DOI: 10.1103/PhysRevA.61.042901
OAI: oai:inspirehep.net:551542
Source
INSPIRE-HEP
License
Unknown
External links

Abstract

Secondary-electron yields were investigated for 28-MeV protons, 126-MeV oxygen-ions, and 182-MeV gold ions incident on 304 stainless-steel surfaces. The dependence on the incidence angle was studied in detail, and a system was developed which allows accurate measurements to be performed over a wide angular range extending to nearly grazing collisions. Electron yield estimates of interest for future accelerator applications are developed for 1-GeV protons, and the possible mitigation of deleterious effects by using serrated rather than flat surfaces is analyzed.

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