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Radiation-induced degradation of optoelectronic sensors

Authors
  • Inguimbert, Christophe
  • Nuns, Thierry
  • Hervé, Dominique
  • Vriet, Aurélien
  • Barbero, Juan
  • Moreno, Juan
  • Nedelcu, Alexandru
  • Ducret, Samuel
  • Saint-Pé, Olivier
  • Larnaudie, Franck
  • Gilard, Olivier
  • Aicardi, Corinne
Publication Date
Sep 09, 2019
Source
Kaleidoscope Open Archive
Keywords
Language
English
License
Unknown
External links

Abstract

Space system undergo particularly hard natural radiation environment, but can also potentially be subject to the radiations injected in low earth orbit by the explosion of a nuclear weapons. The increasing use of optoelectronic components in space systems makes the risk assessment regarding the radiation effects of an increasing interest. This paper presents recent results about the degradation of optoelectronic devices in term of atomic displacements. This paper Most of this work has been developed under the EDA contract JIP-ICET2 A-1341-RT-GP within the CapTech Technologies for Components and Modules’ (TCM) in EDA.

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