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Radiation characteristics of a scattering, absorbing dielectric sheet.

Authors
Type
Published Article
Journal
Applied optics
Publication Date
Volume
9
Issue
10
Pages
2359–2361
Identifiers
DOI: 10.1364/AO.9.002359
PMID: 20094262
Source
Medline
License
Unknown

Abstract

The radiation characteristics of a scattering, absorbing dielectric layer can be analyzed using the two-flux method only if the relationship between internal and external reflectivity is known. For asymptotic cases (equal internal and external reflectivities), the solutions reduce to well-known forms.

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