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Quantitative force versus distance measurements in amplitude modulation AFM: a novel force inversion technique.

Authors
Type
Published Article
Journal
Nanotechnology
1361-6528
Publisher
IOP Publishing
Publication Date
Volume
20
Issue
16
Pages
165703–165703
Identifiers
DOI: 10.1088/0957-4484/20/16/165703
PMID: 19420576
Source
Medline
License
Unknown

Abstract

A new method for extracting quantitative data from amplitude modulation dynamic force-distance measurements is developed. The method is based on the harmonic oscillator model of vibrating atomic force microscope cantilevers, and is capable of extracting both the conservative and dissipative parts of the tip-sample interaction from a measurement of oscillation amplitude and phase as a function of distance. Numerical simulations are used to demonstrate the validity of the method. Further proof of the accuracy of this method is provided by a measurement of electrostatic forces between an AFM tip and a graphite sample.

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