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Power, Performance and Area Analysis of Source/Drain Patterning n/p FinFETs based 6T-SRAM cell for 3-nm technology node

Authors
  • BAEK, ROCK HYUN
  • LEE, JUNJONG
  • SEUNGHWAN, LEE
  • JINSU, JEONG
  • YOON, JUN SIK
Publication Date
Jan 06, 2020
Source
[email protected]
License
Unknown
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