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Power Cycling Tests in High Temperature Conditions of SiC-MOSFET Power Modules and Ageing Assessment

Authors
  • Ibrahim, Ali
  • Ousten, Jean-Pierre
  • LALLEMAND, Richard
  • Khatir, Zoubir
Publication Date
Mar 08, 2016
Source
Kaleidoscope Open Archive
Keywords
Language
English
License
Unknown
External links

Abstract

CIPS 2016 - 9th International Conference on integrated Power Electronics Systems, Nuremberg, ALLEMAGNE, 08-/03/2016 - 10/03/2016

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