Power cycling aging tests at 200°C of SiC assemblies for high temperature electronics
- Authors
- Publication Date
- Sep 03, 2013
- Source
- Kaleidoscope Open Archive
- Keywords
- Language
- English
- License
- Unknown
- External links
Abstract
EPE 13 - European Conference on Power Electronics and Applications, Lille, FRANCE, 03-/09/2013 - 05/09/2013
