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Package mTEXO for testing the presence of outliers in exponential samples

Authors
  • Lin, Chien-Tai1
  • Lee, Ying-Chen1
  • Balakrishnan, Narayanaswamy2
  • 1 Tamkang University, Department of Mathematics, New Taipei City, 25137, Taiwan , New Taipei City (Taiwan)
  • 2 McMaster University, Department of Mathematics and Statistics, Hamilton, ON, L8S 4K1, Canada , Hamilton (Canada)
Type
Published Article
Journal
Computational Statistics
Publisher
Springer Berlin Heidelberg
Publication Date
Oct 04, 2018
Volume
34
Issue
2
Pages
803–818
Identifiers
DOI: 10.1007/s00180-018-0843-6
Source
Springer Nature
Keywords
License
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Abstract

We develop an user-interface package mTEXO in the Maplet application for testing exponential upper and/or lower outliers. The distributions of some well-known test statistics for exponential outliers in the literature can be easily evaluated using mTEXO, saving considerable computational time performing numerical integrations and combinatorial algebra necessary in the traditional approach.

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