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Optical-constant calculation over an extended spectral region: application to titanium dioxide film.

Authors
Type
Published Article
Journal
Applied optics
Publication Date
Volume
34
Issue
31
Pages
7355–7360
Identifiers
DOI: 10.1364/AO.34.007355
PMID: 21060609
Source
Medline

Abstract

An iterative algorithm has been developed that takes starting values derived by an envelope method but then minimizes the influence of the envelopes and emphasizes the actual measured data. This combination avoids the difficulties inherent in the accurate drawing of the envelopes and makes it possible to extract the thickness and the optical constants of semiconducting and dielectric films over a wide spectral region, including regions of high absorption.

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