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Optical Coefficients of Nanoscale Copper Films in the Range of 9–11 GHz

Authors
  • Vdovin, V. A.1
  • Andreev, V. G.2
  • Glazunov, P. S.2
  • Khorin, I. A.3
  • Pinaev, Yu. V.1
  • 1 Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Moscow, 125009, Russia , Moscow (Russia)
  • 2 Moscow State University, Moscow, 119991, Russia , Moscow (Russia)
  • 3 Valiev Institute of Physics and Technology, Russian Academy of Sciences, Moscow, 117218, Russia , Moscow (Russia)
Type
Published Article
Journal
Optics and Spectroscopy
Publisher
Pleiades Publishing
Publication Date
Nov 01, 2019
Volume
127
Issue
5
Pages
907–913
Identifiers
DOI: 10.1134/S0030400X19110274
Source
Springer Nature
Keywords
License
Yellow

Abstract

AbstractThe reflectance, transmittance, and absorption coefficient of ultrathin copper films on a quartz substrate have been measured in a waveguide at frequencies of 9–11 GHz. Films less than 5 nm thick are oxidized almost completely and transparent to microwave radiation. A conducting layer is formed at a film thickness above 5 nm; however, the reflectance increases with thickness in the range of 5–15 nm more slowly than is yielded by calculations using the model conductivity of a continuous film. These results can be explained by the film morphology.

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