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On-Wafer Characterization of Silicon Transistors Up To 500 GHz and Analysis of Measurement Discontinuities Between the Frequency Bands

Authors
  • Fregonese, Sebastien
  • De Matos, Magali
  • Deng, Marina
  • Potéreau, Manuel
  • Ayela, Cédric
  • Aufinger, Klaus
  • Zimmer, Thomas
Publication Date
May 30, 2018
Source
Kaleidoscope Open Archive
Keywords
Language
English
License
Unknown
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