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Note: a simple approach to fabricate a microscopic four-point probe for conductivity measurements in ultrahigh vacuum.

Authors
Type
Published Article
Journal
Review of Scientific Instruments
0034-6748
Publisher
American Institute of Physics
Publication Date
Volume
84
Issue
7
Pages
76104–76104
Identifiers
DOI: 10.1063/1.4816536
PMID: 23902121
Source
Medline

Abstract

We present a simple method to fabricate microscopic four-point probe (M4PP) with spacing of 70-100 μm for conductivity measurements in ultrahigh vacuum. The probe includes four gold wires with 30 μm diameter and a 0.5 mm thickness sapphire slice as cantilever. One of the dual scanning tunneling microscope (DSTM) is replaced by M4PP. As a result, in situ transport measurement could be performed by M4PP and investigation of surface morphology by STM. Finally, we measure conductivity of 14 monolayer Bi(111) epitaxial film on n type Si which is 1.6 × 10(-3) Ω(-1)∕[larger open square].

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