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Note: a simple approach to fabricate a microscopic four-point probe for conductivity measurements in ultrahigh vacuum.

Authors
Type
Published Article
Journal
Review of Scientific Instruments
1089-7623
Publisher
American Institute of Physics
Publication Date
Volume
84
Issue
7
Pages
76104–76104
Identifiers
DOI: 10.1063/1.4816536
PMID: 23902121
Source
Medline

Abstract

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