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Noise-induced permanent threshold shifts in the occupational noise and hearing survey: an explanation for elevated risk estimates.

Authors
  • Dobie, Robert A
Type
Published Article
Journal
Ear and Hearing
Publisher
Ovid Technologies (Wolters Kluwer) - Lippincott Williams & Wilkins
Publication Date
Aug 01, 2007
Volume
28
Issue
4
Pages
580–591
Identifiers
PMID: 17609618
Source
Medline
License
Unknown

Abstract

High-frequency median NIPTS estimates from ONHS data are consistent with the predictions of ISO-1999. Differences between exposed and control low-frequency thresholds in the ONHS are higher than predicted by ISO-1999, but these differences probably are related more to socioeconomic or test procedure effects than to occupational noise exposure. These low-frequency effects explain why excess risk estimates from the ONHS are higher than those based on ISO-1999.

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