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Near-edge x-ray absorption fine-structure investigation of graphene

Authors
  • Pacile, D.
  • Papagno, M.
  • Rodriguez, A. Fraile
  • Grioni, M.
  • Papagno, L.
Publication Date
Apr 01, 2010
Identifiers
DOI: 10.1103/PhysRevLett.101.066806
OAI: oai:infoscience.tind.io:148040
Source
Infoscience @ EPFL
License
Unknown
External links

Abstract

We report the near-edge x-ray absorption fine-structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of highly ordered pyrolytic graphite on a SiO2 substrate. We utilized a photoemission electron microscope to separately study single-, double-, and few-layers graphene samples. In single- layer graphene we observe a splitting of the pi* resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.

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