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Multi-microscopy study of the influence of stacking faults and three-dimensional In distribution on the optical properties of m-plane InGaN quantum wells grown on microwire sidewalls

Authors
  • Mancini, L.
  • Hernández-Maldonado, D.
  • Lefebvre, W.
  • Houard, J.
  • Blum, I.
  • Vurpillot, F.
  • Eymery, J.
  • Durand, C.
  • Tchernycheva, M.
  • Rigutti, L.
  • Eymery, Joël
Type
Published Article
Journal
Applied Physics Letters
Publisher
American Institute of Physics
Publication Date
Jan 25, 2016
Volume
108
Identifiers
DOI: 10.1063/1.4940748
Source
MyScienceWork
License
Unknown
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