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Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

Authors
  • Lambrecht, Niels
  • De Zutter, Daniël
  • Vande Ginste, Dries
  • Pues, Hugo
Publication Date
Jan 01, 2017
Source
Ghent University Institutional Archive
Keywords
Language
English
License
Unknown
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Abstract

In this paper, we model the inductive current clamp (ICC) method described in the ISO 7637-3 standard, where we apply a broadband transient signal as disturbance. To validate the advocated model, a nonlinear device under test (DUT) is simulated, manufactured and measured under the ISO 7637-3 standard test conditions. Furthermore, it is shown that the proposed model can be used to study the DUT's immunity.

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