Affordable Access

Access to the full text

Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Authors
  • Kravitz, S.1
  • Smith, R. J.2
  • Hagaman, L.2
  • Bernard, E. P.2
  • McKinsey, D. N.1, 2
  • Rudd, L.2
  • Tvrznikova, L.1, 2, 3, 4
  • Gann, G. D. Orebi1, 2
  • Sakai, M.1, 2
  • 1 Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, 94720, USA , Berkeley (United States)
  • 2 University of California Berkeley, Berkeley, CA, 94720, USA , Berkeley (United States)
  • 3 Yale University, 217 Prospect St., New Haven, CT, 06511, USA , New Haven (United States)
  • 4 Lawrence Livermore National Laboratory, Livermore, CA, USA , Livermore (United States)
Type
Published Article
Journal
The European Physical Journal C
Publisher
Springer-Verlag
Publication Date
Mar 21, 2020
Volume
80
Issue
3
Identifiers
DOI: 10.1140/epjc/s10052-020-7800-6
Source
Springer Nature
License
Green

Abstract

Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is not well-understood. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.

Report this publication

Statistics

Seen <100 times