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Measurement of wurtzite ZnO/rutile TiO(2) heterojunction band offsets by x-ray photoelectron spectroscopy

Authors
  • Wang, J
  • Liu, XL
  • Yang, AL
  • Zheng, GL
  • Yang, SY
  • Wei, HY
  • Zhu, QS
  • Wang, ZG
Publication Date
Jan 01, 2011
Source
Knowledge Repository of SEMI,CAS
Keywords
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Abstract

The valence-band offset of the wurtzite ZnO/rutile TiO(2) heterojunction was directly determined by x-ray photoelectron spectroscopy. The wurtzite ZnO (0001) layer was grown on commercial rutile (101) TiO(2) by metal-organic chemical-vapor deposition. The results show that the valence-band offset is 0.14 +/- 0.05 eV, which agrees well with previous results by other methods. Therefore, the conduction-band offset is deduced from their known band-gap energy values to be 0.45 +/- 0.05 eV, which indicates a type-II band alignment for the ZnO/TiO(2) heterojunction.

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