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Localization of an ultrathin buried Fe layer in a multilayer structure Nb/Fe/[Mo/Si]40/SiO2 by means of X-ray standing waves

Authors
  • Andreeva, M. A.1, 2
  • Gribova, A. D.1, 2
  • Odintsova, E. E.1, 2
  • Borisov, M. M.3
  • Kovalchuk, M. V.3
  • Mukhamedzhanov, E. Kh.3
  • 1 Moscow State University, Faculty of Physics, Leninskiye Gory, Moscow, 119991, Russia , Leninskiye Gory, Moscow (Russia)
  • 2 Solid State Physics Department, Moscow, Russia , Moscow (Russia)
  • 3 Russian Research Centre Kurchatov Institute, pl. Kurchatova 1, Moscow, 123182, Russia , Moscow (Russia)
Type
Published Article
Journal
Moscow University Physics Bulletin
Publisher
Allerton Press, Inc.
Publication Date
Aug 01, 2009
Volume
64
Issue
4
Pages
437–441
Identifiers
DOI: 10.3103/S0027134909040183
Source
Springer Nature
Keywords
License
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Abstract

An analysis of the influence of standing waves on the angular dependencies of the fluorescent yield from an ultrathin iron layer buried inside a multilayer structure of Nb(50 nm)/Fe(3.9 nm)/[Si/Mo(6.77 nm)]40/SiO2 is presented. These angular dependencies of reflectivity and FeKα-fluorescence yield were measured at the Station for high-precision X-ray optics (HPXO) of the Kurchatov Center for Synchrotron Radiation and Nanotechnology. The measured data was analyzed with the help of our FLUO software package. As a result of the complex treatment of reflectivity and Fe fluorescent yield data, the depth profile for iron atomic density was restored.

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