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Lattice contrast in the core-loss EFTEM signal of graphene.

Authors
  • Mohn, Michael J1
  • Biskupek, Johannes2
  • Lee, Zhongbo2
  • Rose, Harald2
  • Kaiser, Ute3
  • 1 Materialwissenschaftliche Elektronenmikroskopie, Universität Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany. Electronic address: [email protected] , (Germany)
  • 2 Materialwissenschaftliche Elektronenmikroskopie, Universität Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany. , (Germany)
  • 3 Materialwissenschaftliche Elektronenmikroskopie, Universität Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany. Electronic address: [email protected] , (Germany)
Type
Published Article
Journal
Ultramicroscopy
Publication Date
Dec 01, 2020
Volume
219
Pages
113119–113119
Identifiers
DOI: 10.1016/j.ultramic.2020.113119
PMID: 32987248
Source
Medline
Keywords
Language
English
License
Unknown

Abstract

The realization of chromatic aberration correction enables energy-filtered transmission electron microscopy (EFTEM) at atomic resolution even for large energy windows. Previous works have demonstrated lattice contrast from ionization-edge signals such as the L2,3 edges of silicon or titanium. However, the direct interpretation as chemical information was found to be hampered by contributions from elastic contrast with dynamic scattering, especially for thick samples. Here we demonstrate that even for thin samples with light atoms, the interpretation of the ionization-edge signal is complicated by inversions from bright-atom to dark-atom contrast. Our EFTEM experiments for graphene show lattice contrast in the carbon K-edge signal, and we find bright-atom and dark-atom contrast for different defoci. Copyright © 2020 Elsevier B.V. All rights reserved.

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