Affordable Access

Interferometric laser diode probing of micrometer- and nanometer-scale materials.

Authors
  • Sherman, Gregory W
  • Bradley, Curtis C
Type
Published Article
Journal
Applied optics
Publication Date
Nov 01, 2003
Volume
42
Issue
31
Pages
6360–6366
Identifiers
PMID: 14649279
Source
Medline
License
Unknown

Abstract

We are developing a method for real-time detection, tracking, and categorization of micrometer- and nanometer-scale particles and materials using light scattered from a swept standing-wave probe. Synchronous, phase-sensitive detection of the weakly scattered optical field is exploited to provide interferometric sensitivity and improve the signal-to-noise ratio, allowing use of low-power laser diode sources and photodiode detectors. To demonstrate the technique, we probe a set of W, C, and Cu microfibers and determine diameters and refractive-index values from a detailed comparison of light-scattering data and a numerical model. We extrapolate these results and discuss the application of laser diode sources and photodiode receivers for the detection and study of nanoscale materials.

Report this publication

Statistics

Seen <100 times