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Implementation and operation of a fiber-coupled CMOS detector in a low energy electron Microscope.

Authors
  • Janoschka, D1
  • Dreher, P2
  • Rödl, A2
  • Franz, T3
  • Schaff, O4
  • Horn-von Hoegen, M2
  • Meyer Zu Heringdorf, F-J2
  • 1 Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen, Lotharstrasse. 1, 47057 Duisburg, Germany. Electronic address: [email protected] , (Germany)
  • 2 Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen, Lotharstrasse. 1, 47057 Duisburg, Germany. , (Germany)
  • 3 ELMITEC Elektronenmikroskopie GmbH, Albrecht-von-Groddeck-Str.3, 38678 Clausthal-Zellerfeld, Germany. , (Germany)
  • 4 SPECS Surface Nano Analysis GmbH, Voltastrasse 5, 13355 Berlin, Germany. , (Germany)
Type
Published Article
Journal
Ultramicroscopy
Publication Date
Nov 27, 2020
Volume
221
Pages
113180–113180
Identifiers
DOI: 10.1016/j.ultramic.2020.113180
PMID: 33290983
Source
Medline
Keywords
Language
English
License
Unknown

Abstract

The intrinsically weak signals in ultrafast electron microscopy experiments demand an improvement in the signal-to noise ratio of suitable electron detectors. We provide an experience report describing the installation and operation of a fiber-coupled CMOS based detector in a low energy electron microscope. We compare the detector performance to the traditional multi-channel-plate-based setup. The high dynamic range CMOS detector is capable of imaging spatially localized large intensity variations with low noise. The detector is blooming-free and overexposure appears uncritical. Overall, we find dramatic improvements in the imaging with the fiber-coupled CMOS detector compared to imaging with our previously used multi-channel-plate detector. Copyright © 2020 Elsevier B.V. All rights reserved.

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