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Grazing incidence small angle X-ray scattering on colloidal crystals.

Authors
  • Huber, Patrick
  • Bunk, Oliver
  • Pietsch, Ullrich
  • Textor, Marcus
  • Geue, Thomas
Type
Published Article
Journal
The Journal of Physical Chemistry B
Publisher
American Chemical Society
Publication Date
Oct 07, 2010
Volume
114
Issue
39
Pages
12473–12479
Identifiers
DOI: 10.1021/jp103943y
PMID: 20839892
Source
Medline
License
Unknown

Abstract

Grazing incidence small-angle X-ray scattering (GISAXS) is used for nondestructive characterization of colloidal crystals of different numbers of hexagonally dense packed layers fabricated by convective self-assembly. Whereas small crystallites with random orientation were obtained in case of monolayers, the scattering data obtained from multilayer samples revealed colloidal domains over areas of a few centimeters where the single crystalline domains are mainly aligned along the growth direction. The data indicates an increasing degree of self-organization going from monolayers to multilayers. Within the multilayer samples, the stacking sequence of the hexagonally packed layers is evaluated using a numerical model for fitting the X-ray scattering data containing the stacking parameter, a. Compared with an expected complete random stacking with a = 0.5, the fitted stacking parameter, a = 0.63 ± 0.01, averaged over a sample area of about 1 mm(2) indicates a preference for a cubic stacking sequence. This value is smaller than reported by various local probe techniques.

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