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Forensic Characterization of Lipsticks Using Time-of-Flight Secondary Ion Mass Spectrometry

Authors
  • Lee, Jihye1
  • Lee, Yeonhee1
  • 1 Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, 02792, Korea , Seoul (South Korea)
Type
Published Article
Journal
Journal of Analytical Chemistry
Publisher
Pleiades Publishing
Publication Date
Jul 03, 2021
Volume
76
Issue
7
Pages
854–867
Identifiers
DOI: 10.1134/S1061934821070091
Source
Springer Nature
Keywords
Disciplines
  • Articles
License
Yellow

Abstract

AbstractLipstick smear analysis can provide valuable information in forensic investigations, but it is difficult to distinguish lipstick products because their complex compositions can vary with the brand and product. In this study, various lipstick samples were analyzed using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR). ATR-FTIR method was useful for preliminary categorization of lipstick. Generally, ToF-SIMS provides chemical information about sample surfaces. Each lipstick sample showed characteristic ion peaks in the ToF-SIMS spectra. To investigate the effect of the substrate on the ToF-SIMS spectra, two lipsticks were applied to five different substrates (white paper, glass slide, tissue paper, orange cotton fabric, and black cotton fabric) and analyzed using principal component analysis. Trace lipstick smears deposited on tissue paper and cigarette butts were analyzed and compared with results from reference lipstick samples. ToF-SIMS is a promising technique for discrimination and classification of lipsticks in forensic science.

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