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Determination of X-ray structure factors from half-value widths of diffraction curves obtained with the triple-crystal arrangement

Authors
Journal
Physics Letters A
0375-9601
Publisher
Elsevier
Publication Date
Volume
37
Issue
1
Identifiers
DOI: 10.1016/0375-9601(71)90316-1

Abstract

Abstract The f-values of X-rays were determined from the half-value widths of diffraction curves obtained with a triple-crystal diffractometer. The 111, 422 and 333 reflections for silicon and the 111 and 220

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