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Microstructure ofa-plane ZnO grown on LaAlO3(001)

Authors
Publisher
Elsevier B.V.
Publication Date
Volume
518
Issue
11
Identifiers
DOI: 10.1016/j.tsf.2009.09.186
Keywords
  • A-Plane Zno
  • Laalo3
  • Domains
  • Microstructure

Abstract

Abstract The microstructure of a-plane ZnO grown on LaAlO 3 (LAO) (001) has been systematically investigated by employing X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). Based on the results of XRD and TEM, only a-plane ZnO has been found to grow on LAO (001), and it consists of two types of domains perpendicular to each other. The crystal orientation relationships of a-plane ZnO domains with LAO have been verified to be [0001] ZnO//[110] LAO and [11̄00] ZnO//[11̄0] LAO. The domain boundaries in the a-plane ZnO are along the direction in a rotation angle of about 45° from the c-axes of ZnO. The surface morphology of ZnO films in SEM exhibits domain structure in stripe-like shape. The formation of two domains can be attributed to the cubic symmetry of the surface configuration of LAO (001).

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