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Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current

Authors
Journal
Microelectronics Reliability
0026-2714
Publisher
Elsevier
Publication Date
Volume
46
Identifiers
DOI: 10.1016/j.microrel.2006.07.078

Abstract

Abstract Based on the on-state voltage drop monitoring at high current, an alternative method for thermo-sensitive parameters calibration is reported. The main goal is that it allows the simultaneous calibration of the series resistance and power devices voltage drop on temperature. Thereby, the average temperature over all power devices and the temperature difference in average inside the pack can be measured in real applications.

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