Affordable Access

Publisher Website

X-ray reflectometry characterization of SON 68 glass alteration films

Journal of Non-Crystalline Solids
Publication Date
DOI: 10.1016/s0022-3093(03)00321-1


Abstract This paper presents the first direct and simultaneous density and thickness measurements by X-ray reflectometry (XRR) of films that develop during aqueous alteration of the French SON 68 (R7T7-type) nuclear glass which is a multi-component silicate. The feasibility of XRR for this type of glasses is investigated by comparing the results with those obtained using other techniques. The influence of drying and the presence of crystalline phases on the XRR signal is studied. It is shown that XRR still yields useful data when a traditional method such as solution sampling cannot be used anymore. The evolution of the layers with alteration time was followed during 134 days. Three different steps are observed: an interdiffusion step, the formation of a homogeneous gel and finally an electronic density gradient (porosity and/or composition) within the gels at long reaction times. This density gradient could explain the protective properties of the gel.

There are no comments yet on this publication. Be the first to share your thoughts.


Seen <100 times

More articles like this

Structural studies in Ge22Se68X10(X= Bi, Sb) glass...

on Journal of Non-Crystalline Sol... Jan 01, 1987

SON68 Glass Alteration Enhanced by Magnetite

on Procedia Earth and Planetary S...

Leach testing at 50 °C of α-doped SON68 glass alte...

on Journal of Nuclear Materials Jan 01, 2005

SON 68 nuclear glass alteration kinetics between p...

on Journal of Nuclear Materials Jan 01, 2001
More articles like this..