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High-energy resolution PIXE study of heat induced changes in cadmium compounds using ion microbeam

Authors
Journal
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
0168-583X
Publisher
Elsevier
Publication Date
Volume
158
Identifiers
DOI: 10.1016/s0168-583x(99)00320-1
Keywords
  • Ion Microbeam
  • High-Resolution Pixe
  • Chemical Effects
  • Cadmium
Disciplines
  • Chemistry

Abstract

Abstract The intensity changes of the satellite X-ray line spectra can be related to the changes in the chemical environment of atoms in the sample. High-energy resolution PIXE analysis of chemical effects in X-ray spectra of Cd L lines was applied in studies of heat-treated CdS and CdTe cadmium compounds. The applicability of the method for monitoring crystal phases and chemical states in these and other materials using ion microbeam with high energy resolution PIXE spectrometer is discussed.

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