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Experience in Validation of PowerPCTM Microprocessor Embedded Arrays

Authors
  • Wang, Li-C.1
  • Abadir, Magdy S.1
  • 1 Somerset PowerPC Design Center, Motorola Inc., 6200 Bridgepoint Parkway, Bldg 4, Austin, Texas, 78730, USA , Austin
Type
Published Article
Journal
Journal of Electronic Testing
Publisher
Kluwer Academic Publishers
Publication Date
Aug 01, 1999
Volume
15
Issue
1-2
Pages
191–205
Identifiers
DOI: 10.1023/A:1008352805631
Source
Springer Nature
Keywords
License
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Abstract

Design validation for embedded arrays remains as a challenging problem in today's microprocessor design environment. Although several methods for validating embedded arrays have been proposed, not much has been done to characterize the strengths and weaknesses of these methods. This paper provides a comprehensive study of various design validation approaches adopted at the Somerset PowerPC Design Center in the past, including methods from both formal verification and test generation. Effectiveness of these approaches will be measured based on automatic design error injection and simulation at both gate and transistor levels. Experience of using different validation approaches on recent PowerPC microprocessor arrays will be analyzed and discussed.

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