The power handling capacity of RF components can be limited by a resonant process known as Multipactor effect. Multipactor-induced breakdowns can be critical to microwave systems in space communication payloads or in experimental fusion devices. Multipactor simulations can be used to predict power thresholds but the results highly depend on the electron emission properties of the RF component materials. Moreover, in both space and fusion applications, the RF devices can be subjected to DC magnetic fields. This magnetic field may affect the electron emission properties. In order to improve understanding and predictability of the multipactor effect, the assessment of DC magnetic field on the electron emission properties is required; an experimental setup has been developed to measure the Total Electron Emission Yield (TEEY) under DC magnetic field. The aim of this paper is to describe the newly developed experimental setup and the associated TEEY measurements techniques. The effect of DC magnetic field on the TEEY of copper is investigated.