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Electrically active defects in SiC Schottky barrier diodes

Authors
  • Gelczuk, Łukasz
  • Dąbrowska-szata, Maria
  • Synowiec, Zdzisław
Type
Published Article
Journal
Materials Science-Poland
Publisher
Versita
Publication Date
Mar 01, 2011
Volume
29
Issue
1
Pages
70–75
Identifiers
DOI: 10.2478/s13536-011-0012-x
Source
De Gruyter
Keywords
License
Green

Abstract

The electrical properties of deep-level defects in real packaged SiC Schottky barrier rectifiers were studied by deep level transient spectroscopy (DLTS). One deep-level trap with an activation energy in the 0.29–0.30 eV range was revealed to be present in all the tested samples. The electrical characteristics of the trap indicate it is probably attributed to dislocations or to metastable defects, which can be responsible for discrepancies observed in I-V characteristics (see Ref. [2]).

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