Direct current electrical characterization of ds-DNA in nanogap junctions

Measurements of DNA conductivity, hybridization, and melting using electronic means can have wide applications in molecular electronics and biological sensors. We have fabricated nanogap break-junctions by electromigration through thin gold-on-titanium films. 18-mer thiolated ds-DNA molecules were covalently attached between the electrodes and dc electrical measurements were done. The conductance was measured through the molecule before and after a temperature ramp from 300 to 400 K. A dramatic decrease in conductance was observed, analogous to an electrical fuse, possibly attributed to complete or partial denaturing of the ds-DNA molecules bridging the nanogaps. We also show evidence that the dc resistance of dry DNA strands of the same length decreases with increasing guanine-cytosine content in the sequence with values ranging from 10 M Ω to 2 G Ω. These findings can have important consequences in DNA-based molecular electronics and direct label-free detection of DNA hybridization. The authors acknowledge the support of the NASA Institute for Nanoelectronics and Computing (INAC) at Purdue under Award No. NCC 2-1363 for funding the work.