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Efficient Quasiparticle Evacuation in Superconducting Devices

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Published Article
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Submission Date
Identifiers
DOI: 10.1103/PhysRevB.85.020505
arXiv ID: 1106.4949
Source
arXiv
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Abstract

We have studied the diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles.

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