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Efficient Quasiparticle Evacuation in Superconducting Devices

Authors
  • Rajauria, Sukumar
  • Pascal, L. M. A.
  • Gandit, Ph.
  • Hekking, F. W. J.
  • Pannetier, B.
  • Courtois, H.
Type
Published Article
Publication Date
Jun 24, 2011
Submission Date
Jun 24, 2011
Identifiers
DOI: 10.1103/PhysRevB.85.020505
Source
arXiv
License
Yellow
External links

Abstract

We have studied the diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles.

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