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Effect of the sample annealing temperature and sample crystallographic orientation on the charge kinetics of MgO single crystals subjected to keV electron irradiation.

Authors
Type
Published Article
Journal
Journal of microscopy
Publication Date
Volume
258
Issue
1
Pages
59–67
Identifiers
DOI: 10.1111/jmi.12217
PMID: 25651867
Source
Medline
Keywords
  • Annealing Temperature Effect
  • Mgo
  • Logarithm Of The See Yield (Lnσ)

Abstract

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