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Effect of the sample annealing temperature and sample crystallographic orientation on the charge kinetics of MgO single crystals subjected to keV electron irradiation.

Authors
  • Boughariou, A1
  • Damamme, G
  • Kallel, A
  • 1 LaMaCoP, Université de Sfax pour le sud, Faculté des Sciences, Sfax, Tunisie.
Type
Published Article
Journal
Journal of microscopy
Publication Date
Apr 01, 2015
Volume
258
Issue
1
Pages
59–67
Identifiers
DOI: 10.1111/jmi.12217
PMID: 25651867
Source
Medline
Keywords
License
Unknown

Abstract

This paper focuses on the effect of sample annealing temperature and crystallographic orientation on the secondary electron yield of MgO during charging by a defocused electron beam irradiation. The experimental results show that there are two regimes during the charging process that are better identified by plotting the logarithm of the secondary electron emission yield, lnσ, as function of the total trapped charge in the material QT. The impact of the annealing temperature and crystallographic orientation on the evolution of lnσ is presented here. The slope of the asymptotic regime of the curve lnσ as function of QT, expressed in cm(2) per trapped charge, is probably linked to the elementary cross section of electron-hole recombination, σhole, which controls the trapping evolution in the reach of the stationary flow regime.

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