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Short-period X-ray multilayers based on Cr/Sc, W/Sc

Authors
Journal
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
0168-9002
Publisher
Elsevier
Publication Date
Volume
405
Identifiers
DOI: 10.1016/s0168-9002(97)00163-0
Keywords
  • Section Ii. Instrumentation
Disciplines
  • Medicine

Abstract

Abstract New experimental results on fabrication and investigations of X-ray properties of multilayer X-ray mirrors based on Cr/Sc and W/Sc for close-to-normal and Brewster's angles of incidence are presented. It is experimentally shown that the peak reflection coefficient of the mirrors Cr/Sc with the periods of 1.6–1.7 nm for the wavelength 3.14 nm reaches 10% at the resolution λ Δλ up to 175. The reflection coefficient of the mirrors at the Brewster's angle reaches 10–12%. The high reflectivity of the mirrors allows to use them for creation of multi-mirror schemes for the X-ray microscopy and astronomy, X-ray diagnostics of high-temperature plasma.

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