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Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs

Authors
  • Borodina, Yulia V.1
  • 1 Bauman Moscow State Technical University, Russia , (Russia)
Type
Published Article
Journal
Discrete Mathematics and Applications
Publisher
De Gruyter
Publication Date
Oct 17, 2020
Volume
30
Issue
5
Pages
303–306
Identifiers
DOI: 10.1515/dma-2020-0026
Source
De Gruyter
Keywords
License
Yellow

Abstract

We consider Boolean circuits in Zhegalkin basis and describe all Boolean functions that can be implemented by a circuit admitting a complete fault detection test of length 1 in case of constant faults of type “1” at gate outputs.

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